PhD Monitor
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Engineering and Physics● Open⏰ 1 days leftPreview

PhD Position Digital Holography for Metrology

Design advanced digital holography systems and machine learning algorithms for semiconductor metrology.

Best for:Best for applied physics or electrical engineering graduates with a strong interest in optics, signal processing, and machine learning.

Delft University of Technology (TU Delft) · Delft, Netherlands · R1 · First-stage researcher
More professors at Delft University of Technology (TU Delft)
Digital HolographyMetrologyOptical ImagingTomographic ReconstructionSignal ProcessingMachine Learning
Deadline
Oct 15, 2026
1 days
Funding
Salaried
€3.2k–€4.1k/mo
Start date
flexible
Full-time
Location
Delft
Netherlands

Overview

Delft University of Technology is seeking a doctoral candidate to research advanced digital holography for semiconductor metrology applications. The project involves designing multi-angle and multi-wavelength imaging systems to visualize complex multi-layered structures, rough surfaces, and defects. The candidate will develop tomographic reconstruction and signal processing algorithms optimized with machine learning techniques to balance accuracy and imaging speed. Working within the Faculty of Applied Sciences, the successful applicant will collaborate closely with academic partners and high-tech industry stakeholders. The position is structured as a four-year doctoral training program with an initial evaluation period.

Digital HolographyMetrologySemiconductorOpticsSignal ProcessingMachine LearningApplied PhysicsTomography

What you'll do

  • Design and construct advanced digital holography systems for visualizing complex optical samples
  • Utilize multi-angle and multi-wavelength measurements inspired by optical coherence tomography
  • Develop advanced signal processing and tomographic reconstruction algorithms for accurate sample estimation
  • Investigate and optimize the trade-off between estimation accuracy and imaging speed
  • Apply machine learning techniques to improve algorithm speed and accuracy for real-time applications
  • Apply developed metrology techniques to semiconductor samples in collaboration with industry partners

Requirements

Degree required: MSc in Applied Physics, Electrical Engineering, or equivalent

Degree offered: PhD

Language: English; good communication skills required

Instruction: English

Required skills
  • Demonstrable interest in optics and building high-performance imaging systems
  • Background in signal processing, mathematics, or machine learning
  • Strong foundation in applied physics principles
Nice to have
Experience with optical tomography or holographic systemsPrior research experience in semiconductor metrologyProficiency in machine learning frameworks for data processing

Funding & terms

Type
Salaried
Amount
€3.2k–€4.1k/mo
Duration
4 years
Programme
Delft University of Technology
Delft University of Technology

How to apply

Deadline: 2026-10-15

Interested candidates should submit their application online through the official portal before the specified deadline. Upload all required documents in English, including a motivation letter, CV, grades, and thesis summary.

Documents required
  • Cover letter
  • CV
  • Grades
  • Summary of MSc/PhD thesis
  • List of publications
↗Apply on site

Contact

J. Kalkman· Contact Person

j.kalkman@tudelft.nl

JK
Prof.
J. Kalkman
Faculty of Applied Sciences
Lab
Faculty of Applied Sciences
Delft University of Technology (TU Delft)
Netherlands
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