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Optical Metrology and Nanophotonics● Open⏰ 1 days leftPreview

PhD Position in Amplitude and Phase Control for Optical Metrology

Develop cutting-edge optical metrology techniques to advance nanoscale precision in semiconductor manufacturing.

Best for:Best for recent MSc graduates in Applied Physics, Electrical Engineering, or related fields with a strong interest in optics, electromagnetic scattering, and machine learning.

Delft University of Technology (TU Delft) · Delft, Netherlands · R1 · First-stage researcher
More professors at Delft University of Technology (TU Delft)
coherent optical scatterometrynanoscale precision measurementamplitude and phase control in opticsmachine learning for metrologysemiconductor manufacturing challengeselectromagnetic scattering theory
Deadline
Oct 15, 2026
1 days
Funding
Salaried
€3.2k–€4.1k/mo
Start date
flexible (expected soon after selection)
Full-time
Location
Delft
Netherlands

Overview

This PhD position at Delft University of Technology focuses on advancing optical metrology, a critical technology for semiconductor manufacturing. The project aims to innovate novel methods for controlling amplitude and phase in optical probes, improving the precision of nanoscale measurements. The successful candidate will collaborate with a research group specializing in coherent optical scatterometry, integrating theoretical modeling, experimental validation, and machine learning. The work spans fundamental physics, applied mathematics, and high-tech industry applications, with a strong emphasis on interdisciplinary collaboration. The role is ideal for motivated researchers passionate about optics, signal processing, and computational methods, seeking to contribute to next-generation metrology tools.

optical metrologynanophotonicssemiconductor manufacturingcoherent scatterometrymachine learning applicationselectromagnetic theorynanoscale precisionoptical probe control

What you'll do

  • Develop novel theoretical models for controlling amplitude and phase in optical probes to enhance metrology precision.
  • Conduct experimental validation of proposed techniques using advanced optical setups and measurement tools.
  • Integrate machine learning methods to improve shape retrieval, overlay error detection, and geometrical parameter extraction.
  • Collaborate with partners in applied physics, applied mathematics, and high-tech industry to refine and implement solutions.
  • Publish findings in high-impact scientific journals and present results at international conferences.
  • Participate in interdisciplinary research projects and contribute to knowledge dissemination within the research group.

Requirements

Degree required: Master of Science (MSc) in Applied Physics, Electrical Engineering, or an equivalent degree in a related field

Degree offered: PhD

Language: English; proficiency sufficient for academic research, writing, and oral presentations

Instruction: English

Required skills
  • Strong theoretical background in optics, electromagnetic scattering, and signal processing
  • Proficiency in mathematical modeling and computational techniques
  • Basic programming skills (willingness to learn advanced coding for simulations and data analysis)
  • Ability to work both independently and collaboratively in a team environment
  • Excellent communication skills in English for academic writing and presentations
Nice to have
Prior experience with machine learning frameworks (e.g., TensorFlow, PyTorch)Familiarity with experimental optical setups and data acquisition systemsKnowledge of semiconductor manufacturing processes or nanotechnology applications
Eligibility
  • No specific nationality restrictions, but English proficiency is mandatory
  • Applicants must be eligible for admission to a PhD programme at TU Delft
  • No age restrictions, but candidates should demonstrate academic potential and enthusiasm for research

Funding & terms

Type
Salaried
Amount
€3.2k–€4.1k/mo
Duration
4 years (2 contracts: initial 1.5 years with progress assessment, followed by 2.5 years if successful)
Programme
Delft University of Technology (TU Delft)
Delft University of Technology (TU Delft)

How to apply

Deadline: 2026-10-15 (Europe/Amsterdam)

Applicants must submit their application online via the TU Delft portal before the deadline. Required documents include a letter of motivation, detailed CV, academic transcripts, a summary of MSc/PhD thesis (if applicable), and a list of publications (if any). Shortlisted candidates will be invited for an interview and may be asked to provide referee contact details.

Documents required
  • Letter of application with motivation for pursuing a PhD
  • Detailed CV
  • Academic transcripts (BSc and MSc)
  • Summary of MSc/PhD thesis
  • List of publications (if applicable)
↗Apply on site

Contact

Dr. Omar El Gawhary· Supervisor

o.elgawhary@tudelft.nl

OE
Prof.
Omar El Gawhary
Faculty of Applied Sciences
Lab
Research group in coherent optical scatterometry
Delft University of Technology (TU Delft)
Netherlands
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