PhD Position in Next-Gen Surface Analysis for Ultrathin Functional Materials
Develop advanced multi-energy XPS/HAXPES methodologies for characterizing ultrathin oxides and quantum device interfaces.
Best for:Best for master's graduates in materials science, physics, or chemistry with a strong background in surface characterization and spectroscopy.
Overview
Université Grenoble Alpes and LETI offer a fully funded doctoral position focused on developing quantitative multi-energy and angle-resolved XPS and HAXPES methodologies. The project leverages a newly installed 300-mm characterization tool to study ultrathin oxides, oxynitrides, and sensitive interfaces for advanced CMOS and quantum Josephson junctions. The successful candidate will validate measurement accuracy, establish protocols for quasi in situ sample transfer, and work within an interdisciplinary multi-partner framework. Applicants are expected to conduct rigorous laboratory metrology, analyze complex chemical composition data, and contribute to next-generation quantum and microelectronic technologies.
What you'll do
- Develop quantitative multi-energy and angle-resolved XPS and HAXPES methodologies for ultrathin oxide and oxynitride films
- Validate measurement accuracy and chemical stoichiometry control at the sub-nanometer scale
- Establish robust protocols for quasi in situ transfer of sensitive layered materials
- Apply surface characterization techniques to advanced CMOS stacks and quantum Josephson junctions
- Collaborate closely with multi-partner industrial and academic research teams
- Analyze, interpret, and present experimental data at scientific meetings and in peer-reviewed journals
Requirements
Degree required: Master of Science or equivalent degree in Physics, Materials Science, Chemistry, or related discipline
Degree offered: PhD
Language: English or French proficiency as per doctoral school standards
Instruction: English / French
- Strong academic background in condensed matter physics, materials science, or physical chemistry
- Demonstrated knowledge or hands-on experience with surface characterization techniques
- Familiarity with thin film deposition, semiconductor physics, or vacuum systems
- Strong analytical and data interpretation skills
- Ability to work effectively within collaborative, multi-partner research environments
- Must hold a recognized master's degree or equivalent qualifying the candidate for doctoral studies
Funding & terms
How to apply
Deadline: 2026-11-30 (Europe/Paris)
Submit your application through the official Campus France doctoral portal or contact the listed supervisor directly via email with required academic documents.
- CV
- Cover letter
- BSc + MSc transcripts
- Reference letters
Contact
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