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Micro and Nanotechnology / Power Electronics● OpenPreview

PhD on Reliability and Dynamic Properties of GaN HEMTs

Investigate charge trapping and degradation mechanisms in GaN high electron mobility transistors for next-generation power electronics.

Best for:Best for graduate engineers with a strong background in semiconductor physics, electronic devices, and electrical characterization.

IUT A (LILLE I) · France · R1 · First-stage researcher
More professors at IUT A (LILLE I)
GaN HEMTsPower ElectronicsCharge TrappingSemiconductor ReliabilityTCAD Simulation
Deadline
Nov 30, 2026
46 days
Funding
Salaried
CEA contract
Start date
2026-10-01
Fixed-term
Location
France
on-site

Overview

This PhD project explores the fundamental dynamics of charge carriers and reliability challenges in Gallium Nitride High Electron Mobility Transistors (GaN HEMTs) to support high-efficiency power electronics in data centers. Hosted at CEA-Leti in collaboration with a multidisciplinary research team, the candidate will analyze electrical behavior under various operating conditions and study the physical origins of on-resistance and threshold voltage drifts. The findings will directly contribute to optimizing device architectures and enhancing the robustness of power conversion systems. Applicants are expected to engage in process engineering, advanced electrical testing, and TCAD simulations.

GaN HEMTreliabilitypower electronicscharge trappingelectrical characterizationTCAD simulationsemiconductors

What you'll do

  • Investigate the physical origins of on-resistance and threshold voltage drifts in GaN HEMTs
  • Analyze the electrical behavior of transistors under diverse operating conditions
  • Identify degradation mechanisms and pathways to enhance device robustness
  • Perform advanced electrical testing and TCAD simulations
  • Collaborate with experts in semiconductor material engineering and device simulation
  • Contribute to the optimization of device architectures for sustainable power electronics

Requirements

Degree required: Master's degree or equivalent in Electrical Engineering, Microelectronics, Physics, or related field

Degree offered: PhD

Language: English; French is not required

Instruction: English

Required skills
  • Strong background in semiconductor physics and electronic devices
  • Experience with electrical characterization techniques
  • Familiarity with device simulation or TCAD tools
  • Analytical and problem-solving skills for degradation analysis
Nice to have
Prior research experience involving GaN power devicesHands-on experience with semiconductor cleanroom processes or electrical test benches

Funding & terms

Type
Salaried
Amount
CEA contract
Duration
36 months
Programme
CEA
CEA

How to apply

Deadline: 2026-11-30

Submit your application through the official portal with all required academic and professional documents before the deadline.

Documents required
  • CV
  • Cover letter
  • Academic transcripts
↗Apply on site

Contact

RL
Prof.
Romain Lavieville
Département Composants Silicium (LETI)
Lab
Laboratoire Caractérisation Electrique et Fiabilité
IUT A (LILLE I)
France
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