Electron beam probing of integrated circuits
Develop advanced scanning electron microscope probing techniques to evaluate hardware security threats in modern integrated circuits.
Best for:Best for graduate students with a background in microelectronics or hardware security interested in semiconductor failure analysis and physical attacks.
Overview
This PhD position at Université Grenoble Alpes, conducted within the LETI laboratory, investigates security vulnerabilities in modern integrated circuits through backside scanning electron microscope (SEM) probing. The project aims to establish reliable sample preparation for backside access, characterize the voltage contrast phenomenon, and evaluate hardware vulnerabilities in recent manufacturing technologies such as FD-SOI. The successful candidate will work closely with research staff to develop instrument modifications and assess risks to cryptographic roots of trust. Applicants should hold a relevant master's degree and demonstrate a strong foundation in hardware security, microelectronics, or failure analysis.
What you'll do
- Design and optimize a reliable sample preparation process for backside access to active regions of integrated circuits.
- Investigate and characterize the voltage contrast phenomenon using scanning electron microscopes.
- Instrument and adapt SEM equipment for active area probing.
- Evaluate the impact of advanced manufacturing technologies on hardware security vulnerabilities.
- Analyze FD-SOI technology for potential intrinsic resilience against electron beam probing threats.
Requirements
Degree required: Master's degree or equivalent in microelectronics, electrical engineering, physics, or a related discipline
Degree offered: PhD
Language: English or French proficiency; no specific language test officially mandated
Instruction: English / French
- Strong background in microelectronics or semiconductor physics
- Familiarity with integrated circuit design or failure analysis
- Experimental skills in laboratory settings
- Analytical mindset for characterizing physical phenomena
- Open to candidates meeting doctoral admission criteria at Université Grenoble Alpes
Funding & terms
How to apply
Deadline: 2026-10-31
Submit your application through the official Campus France doctoral portal before the stated deadline, ensuring all required academic documents are attached.
- CV
- Cover letter
- Master's transcripts
- Degree certificate
Contact
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