PhD Monitor
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Condensed Matter Physics● OpenPreview

Development of 4D-STEM with variable tilts

Advance 4D-Scanning Transmission Electron Microscopy with variable beam tilts for advanced materials characterization.

Best for:Best for graduate students in physics or materials science with a strong background in electron microscopy and advanced materials characterization.

Université Grenoble Alpes · Grenoble, France · R1 · First-stage researcher
More professors at Université Grenoble Alpes
Electron Microscopy4D-STEMNanostructuresMaterials CharacterizationCrystallography
Deadline
Jan 30, 2027
107 days
Funding
Salaried
CEA
Start date
2026-12-01
Fixed-term
Location
Grenoble
France

Overview

This PhD position focuses on developing 4D-Scanning Transmission Electron Microscopy with variable beam tilts (4D-STEMiv) at Université Grenoble Alpes and the CEA technological research department (LETI). The project involves acquiring and processing multi-dimensional electron diffraction datasets to extract high-resolution structural and chemical properties of advanced materials such as nanostructures, 2D materials, and ferroelectric systems. The successful candidate will work closely with expert researchers on methodological challenges in advanced electron microscopy. Applicants are expected to conduct rigorous experimental and analytical research leading to a doctoral thesis.

4D-STEMElectron DiffractionTransmission Electron MicroscopyAdvanced MaterialsNanotechnology

What you'll do

  • Develop and optimize 4D-STEM acquisition protocols with variable beam tilts.
  • Acquire and analyze multi-dimensional electron diffraction datasets.
  • Extract virtual contrasts including bright-field, dark-field, ptychography, and strain mapping.
  • Investigate structural and chemical properties of advanced nanostructures and 2D materials.
  • Integrate and couple 4D-STEMiv techniques with spectroscopic analyses such as EELS and EDX.
  • Disseminate research findings through peer-reviewed publications and conference presentations.

Requirements

Degree required: Master of Science in Physics, Materials Science, or a related discipline

Degree offered: PhD

Language: English or French; no specific language test required

Instruction: English / French

Required skills
  • Strong background in physics or materials science
  • Familiarity with transmission electron microscopy principles
  • Analytical skills for complex dataset processing
  • Experimental aptitude for instrumentation development
Nice to have
Prior experience with scanning transmission electron microscopyProgramming skills for data analysis and automationKnowledge of electron diffraction and crystallography

Funding & terms

Type
Salaried
Amount
CEA
Duration
36 months
Programme
CEA
CEA

How to apply

Deadline: 2027-01-30

Interested candidates should submit their application materials through the designated portal before the specified deadline. Ensure all required academic documents and identification details are included in the submission.

Documents required
  • CV
  • Cover letter
  • Academic transcripts
↗Apply on site

Contact

Nicolas Bernier· Supervisor

nicolas.bernier@cea.fr

0438784767

NB
Prof.
Nicolas Bernier
Département des Plateformes Technologiques (LETI)
Lab
Laboratoire Microscopie Mesures et Défectivité
Université Grenoble Alpes
France
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